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home > back-end semiconductor > vision inspection system > in-pocket Inspection

In-Pocket Inspection

Vision inspection system in-pocket inspection
Vision Model
VsIPM
VsIPML
VsIPMP
VsIPMLP

* Top view
* In-Pocket before sealing
* Optional for dual units inspection
* Optional with Retest function

Descriptions
In-Pocket Mark
In-Pocket Mark Lead
In-Pocket Mark Package
In-Pocket Mark Lead Package
Illustration

Lead Inspection

Lead (width, pitch, length, length variance, span, offset skew) result by in-pocket inspection

Package Inspection

Package (scratches, contamination, chipped off, incomplete mold, void, mold flashes, crack) result by in-pocket inspectionPackage (scratches, contamination, chipped off, incomplete mold, void, mold flashes, crack) result by in-pocket inspection

Mark Inspection

Mark (wrong, shifted, missing, scratches, tilted, misaligned, excess, contrast, extra, broken, double, no mark, illegible) result by in-pocket inspectionMark (wrong, shifted, missing, scratches, tilted, misaligned, excess, contrast, extra, broken, double, no mark, illegible) result by in-pocket inspectionMark (wrong, shifted, missing, scratches, tilted, misaligned, excess, contrast, extra, broken, double, no mark, illegible) result by in-pocket inspection

*Available when the feature is turned on.
**Available when the features is turned on and there is package inspection.