Struggling with defect escapees in low-contrast regions and inaccurate detection in complex wafer design inspection? ViTrox's Smart Threshold algorithm is the ingenious solution you need. Join us as we delve into the world of ViTrox's pixel-level defect detection algorithm, a catalyst that reduces defect escapees and revolutionises wafer inspection.
Smart Threshold detects and analyses small variations of abnormalities in wafers, ensuring accurate inspection results without over-rejection or under-rejection. This powerful algorithm employs a pixel-to-pixel range comparison technique to identify defects on wafers. Each pixel of the unit image being inspected is compared with the corresponding "golden pixel range", a range of ideal pixel values derived from a pre-learned collection of good unit images that will be used as a defect detection threshold during the inspection.
Picture 1: Demonstration of each pixel’s grey value
Any pixel values that deviate from this range are flagged as potential defects. This algorithm excels at enhancing detection capabilities, particularly for defects with low grey value contrast compared to their background.
To demonstrate the effectiveness of Smart Threshold, let's consider a comparison of defect detection capability under its implementation. In picture 2(a), we can observe that there are limitations in detecting low-contrast contamination. In picture 2(b), the algorithm successfully detects low-contrast contamination.
How Smart Threshold Adds Value To Your Inspection Process:
Smart Threshold is specifically designed to inspect defects that exhibit low grey value contrast with their background and wafers with complex designs. Here are ways this algorithm will further enhance your wafer inspection process:
- Enhanced defect detection with lower defect escapee
ViTrox's Smart Threshold algorithm revolutionises wafer inspection by detecting even the tiniest variations with precision. Through pixel-to-pixel range comparison and analysis, it identifies defects that have low contrast with the background. This advanced capability improves defect detection capabilities, significantly reducing the risk of defect escapees. - Accurate and Reliable Results
The performance of Smart Threshold relies on image quality as the algorithm operates on a pixel-based level. With Smart Threshold, defect identification becomes a reliable process without guesswork. ViTrox's inspection software solutions are paired with robust inspection platform hardware and a vision module to capture highly clear and focused images, ensuring the algorithm performs at its best – enabling the delivery of precise defect detection and ensuring high inspection output yield. - Comprehensive Wafer Inspection Coverage
Smart Threshold tackles various challenges in wafer inspection, excelling in detecting surface abnormalities like cracks, chips, contamination, and foreign materials. Whether you face low-contrast regions or intricate wafer designs, Smart Threshold offers a versatile solution tailored to your specific inspection needs. It adapts seamlessly, ensuring comprehensive defect detection across different types of wafers.
Key Takeaway
Unlock the true potential of your wafer inspection process with ViTrox's advanced Smart Threshold algorithm. Say goodbye to unnoticed defects and achieve accurate inspection results.
Ready to explore ViTrox Wafer Inspection Solutions? Contact us at enquiry@vitrox.com to schedule a meeting and embark on a journey with ViTrox's cutting-edge wafer inspection solutions.