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WiX Ai: Smart Wafer AOI Machine

Wafer Vision Inspection Handler


Designed for automated wafer handling and multi-layer inspection in a single platform. Seamlessly adapts to front-end and back-end production lines.



BENEFITS


  • Maximize yield with early detection of critical defects.
  • Reduce human judgment errors with smart algorithms and AI-driven analytics.
  • Achieve high throughput that boost operation efficiency.
  • Future-proof investment with modular hardware and upgradeable software features.

ROBUST INSPECTION ALGORITHM

Dynamic Inspection Region Selection

Configurable Defects Categorization

Flexible Metrology

Customizable E-Map Generation

Smart Threshold with Deep Learning

REVOLUTIONARY HARDWARE DESIGN

Imaging with High Resolution Camera

Automated & Fast Conversion within 3 Magnification Lenses

Raw Wafer Warpage Handling

Robot Arm Wafer Handling

Intelligent Autofocus Technology

Customized LED Lighting

Wafer Backside Inspection

OTHER CAPABILITIES

Raw & Mounted Wafer Loading

SECS/GEM Ready

Data Collection Charting

Yield Optimization by Offline Verifier

Cleanroom Class 1000

Inspection Criteria

Wafer Crack

Die Missing

Discoloration

Edge Burr

Edge Debris

Scratch

Crack

Chipping

OCR

Flexible Dimension Measurement

MOVING TOWARDS INDUSTRY 4.0



V-ONE Programme drives towards a highly customizable one-stop platform which offers data driven decisions in manufacturing by allowing stakeholders to remote, visualize, monitor, control and implement condition-based alerts to reduce downtime and increase throughput.
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