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Wafer Vision Inspection Handler Wi8 i G2

ADVANCED & AUTOMATED SOLUTION


The advanced and automated solution enhances productivity, quality and profitability through robust inspection algorithm and sophisticated hardware design. Our Offline Verifier (OV) offers real-time fail result validation by retrieving marginal defect unit to maximize production yield.



BENEFITS


  • Replace conventional human visual inspection.
  • Provide inspection customization to fit future inspection needs.
  • Provide repeatability and reproducibility inspection results.
  • Customize inspection algorithm.
  • Maximize production throughput and yield.
  • Targeting the market most demanding applications, including: MEMS, RF, CMOS Image Sensor, Memory.

ROBUST INSPECTION ALGORITHM

Dynamic Inspection Region Selection

Configurable Defects Categorization

Flexible Metrology

Customizable E-Map Generation

Smart Threshold with Deep Learning

REVOLUTIONARY HARDWARE DESIGN

Imaging by 25 Megapixels High Resolution Camera

Automated & Fast Conversion within 3 Magnification Lenses

Raw Wafer Warpage Handling

Bernoulli Dual Arm Raw Wafer Robot

Intelligent Autofocus Technology

Customized LED Lighting

Bottom Vision Inspection

REVOLUTIONARY HARDWARE DESIGN

Raw & Mounted Wafer Loading

SECS/GEM Ready

Data Collection Charting

Yield Optimization by Offline Verifier

Color Inspection

Cleanroom Class 10

Inspection Criteria

Wafer Crack

Die Missing

Discoloration

Edge Burr

Edge Debris

Scratch

Crack

Chipping

OCR

Flexible Dimension Measurement

MOVING TOWARDS INDUSTRY 4.0



V-ONE Programme drives towards a highly customizable one-stop platform which offers data driven decisions in manufacturing by allowing stakeholders to remote, visualize, monitor, control and implement condition-based alerts to reduce downtime and increase throughput.
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