The growing trend of the development of miniaturized devices that ensures optimal performance and consumes energy efficiently is driving the need for inspection. Simultaneously, the rising focus on the detection of defects on the wafer in the early stage of the development process has been instrumental in driving the wafer inspection equipment market.
There are multiple steps in the overall manufacturing process of semiconductor wafers, which are undertaken in the course of one to two months. With the help of Wafer Inspection and Metrology, you can have better management of the manufacturing process. If any defects occur early in the process, all the work undertaken in the subsequent time-consuming steps will be wasted. Let's discover how Wafer Inspection and Metrology processes are going to aid your production yield.